The Quanta™ 3D DualBeam™ brings new capabilities and flexibility to engineers and researchers needing to characterize materials, conduct failure analysis or control processes. It combines traditional thermal emission Scanning Electron Microscopy (SEM) with Focused Ion Beam (FIB) to complement your existing characterization laboratory tools and extends your applications range for 3D characterization and nanoanalysis, TEM sample preparation or structural modification of sample surfaces at the nanometer scale.  
  
Quanta 3D FEG  
The Quanta 3D FEG is the most versatile high-resolution, low vacuum SEM/FIB for 2D and 3D material characterization and analysis. Featuring three imaging modes - high vacuum, low vacuum and ESEM, it accommodates the widest range of samples of any SEM system. The Quanta 3D FEG's novel, field-emission electron source delivers clear and sharp electron imaging and increased electron beam current enhances EDS and EBSP analysis. This system also offers the capability for in situ study of the dynamic behavior of materials at different humidity levels (up to 100% RH) and temperatures (up to 1500 °C).  
  
Quanta 3D  
The Quanta 3D brings new capabilities and flexibility to engineers and researchers needing to characterize materials, conduct failure analysis or control processes in an industrial or academic environment. It combines traditional thermal emission scanning electron microscopy (SEM) with focused ion beam (FIB) to complement your existing characterization laboratory tools and extends your applications range for 3D laboratory tools and extends your applications range for 3D characterization and nano-analysis, TEM sample preparation, or structural modification of sample surfaces at the nanometer scale. Setting the Quanta 3D apart from regular SEMs are its integrated micro-sectioning capabilities required to explore the subsurface of the specimen. The Quanta 3D is designed to be just that - a 3D-SEM.  
  
Quanta 3D 200i  
The Quanta 3D 200i is a characterization instrument designed to examine materials, conduct failure analysis and prepare samples in an industrial or academic environment. Combining Quanta scanning electron microscope (SEM) with a high current focused ion beam (FIB), creates a versatile solution for characterizing and modifying materials that is easy to use and has the flexibility to handle any sample type. The current-boosted tungsten SEM provides excellent imaging capability for sub-micron structures while the high current ion column can be used to precisely prepare a sample by removing or depositing material at a rapid rate in small defined areas. The Quanta 3D 200i will enable your laboratory to explore a new way of fast sample preparation, 3D nanoanalysis, TEM, EBSD & atom probe sample preparation or structural modification of sample surfaces at the nanometer scale.