Netzsch - LFA 447 NanoFlash®

Manufactured by  Netzsch
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Thermal diffusivity measurements - made easy

Determination of thermophysical properties is quick, easy and cost-effective with the new LFA 447 NanoFlash® Light Flash System.

A high-performance Xenon flash lamp takes the place of the laser, which is usually employed for this proven technique.

With the integrated sample changer for 4 samples, it is possible to run measurements on several samples automatically. The easily-accessible sample carrier allows short setting periods for test preparation and a high through-put of samples.

Unique is the optional scanning device (MTX) for flat samples up to 50 mm x 50 mm for determining differences in the thermal diffusivity over the entire sample surface with a spatial resolution of 100 µm in the x and y directions.
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Features of LFA 447 NanoFlash®
  • Accurate pulse length correction
  • Heat-loss corrections, all literature models are integrated
  • Non-linear regression for Cowan fit
  • Improved Cape-Lehmann model through consideration of multi-dimensional heat loss and non-linear regression
  • Radiation correction for semi-transparent samples
  • 2- or 3-layers systems: analysis by means of non-linear regression and consideration of heat loss
  • Determination of contact resistance in multi-layer systems
  • Model wizard for selecting the optimum evaluation model
  • Determination of specific heat by means of a comparative method and standard samples
  • Integrated databank
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