HORIBA - XGT-5700WR

Manufactured by  HORIBA
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X-ray Analytical and Imaging Microscope

XGT-5700WR are new lineup of XGT-5000WR series and equipped with new optical system to analyze hazardous elements with high sensitivity. XGT-5700WR support for WEEE/RoHS, ELV and Chinese RoHS

These models have 3mm XGT with multi-filter with 4 specific filters (Pb/Cd/Cr,Cl/5 WR elements) and 100 µm XGT as standard and 10 µm is optional instead of 100 µm. Secondary filter(between sample and detector) with ON/OFF positions are also equipped. Improved detection sensitivity is realized through the use of a dual filter. Compliant with WEEE/RoHS, ELV Chinese RoHS directives

XGT-5700WR is equipped with dewar of liquid nitrogen. XGT-5700WR Type S/SL model with big sample room are lineuped.
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Features of XGT-5700WR
  • Increased detection sensitivity with a new optical system 3mm X-ray irradiation diameter and dual filter system (Primary and Secondary filters)
  • Capable of both minute area analysis and high sensitivity analysis Minute area analysis: 10(with no filter) or 100 µm (with no filter) X-ray irradiation diameter High sensitivity analysis: 3mm X-ray irradiation diameter and dual filter system
  • Maintains the same ease of operation as previous systems to promote efficient on-site work Preset measuring conditions for materials ranging from resins to metals A lineup of data management software is available that is compatible with various data format Can be used to analyze hazardous elements in Ni and Sn plating (When using the multilayer film FPM option)
  • Internal analysis using element mapping for minute area and transmission image Applications ranging from point measurement to surface measurement
General Specifications
Depth 833 mm
Height670 mm
Width 680 mm
Power Requirements AC100, 120, 220, 240V 50/60Hz
Weight280 kg
Additional Specifications

Principle:
Energy dispersive X-ray fluorescence analyzer
Element:
Na to U (in sample atmosphere)
Sample:
Plastic, metal, paper, liquid such as paint and ink, biological samples etc
Sample chamber atmosphere:
Atmosphere
XGT Element Spatial Resolution:
3mm+100µm or 3mm+10µm
X-ray tube:
50kV/1mA, Rh target
Vacuum probe:
Standard
Primary X-ray Filter:
Ø3mm:Multifilter with 4 specific filters(Pb/Cd/Cr,Cl/5WR elements)
Ø100µm: Filter less
Ø10µm: Filter less
Secondary X-ray filter:
Standard
Detector:
High purity Si detector
Transmission X-ray detector: NaI(Ti) scintillator
Stage:
100mm×100mm(Maximum mapping area)
200mm×200mm(Optional)
Sample chamber:
400×350×40mm(Additional special order is possible)

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