Nikon - Eclipse LV-DAF
The perfect upright microscope with an auto-focus system solution for Eclipse LV microscopes and OEM applications.
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Features of Eclipse LV-DAF
- Hybrid Auto-Focus
- Design
- Compatibility with LV Series Microscopes
- Software Development Kit
- Control
- Auto-Adjustment Program
- LED Light Source
- Multiple Observation Methods
- Large Focal Range
General Specifications
| Power Requirements | 100-240 V AC, 1.0 A, 50/60 Hz |
| Microscope Type | Upright |
Additional Specifications
Detection system:
Hybrid system combining slit projection with contrast detection
Auto-focus light source:
Near-IR LED (Λ = 770 nm)
Objective lens:
CFI60 objective lens 2.5x-100x (includes extra-long working distance (ELWD), super-long working distance (SLWD), and CR for LCD substrate inspection)
Auto-focus modes:
Continuous mode and search mode (single, continuous)
Focal range:
Focal range without searching (brightfield)²
2.5x: 5.5 mm or more, 5x: 4.5 mm or more, 10x: 1.3 mm or more, 20x: 320 Μm or more, 50x: 50 Μm or more, 100x: 10 Μm or more
Focal time:
0.7 seconds or less (20x: 200Μm with no search)² ³
Focal precision (repeated reproducibility):
1/2 or less of focal depth² ³
AF offset feature:
Enables observation with precise adjustment of focal position while applying auto-focus
Minimum drive resolution:
0.05 Μm¹
External communication:
RS232C, USB, and parallel I/O