Hitachi Equipment List
Hitachi - Focused Ion & Electron Beam System nanoDUE'T NB5000
Manufactured by Hitachi
The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky...
Hitachi - Micro-sampling System
Manufactured by Hitachi
This device is used for preparing the desired wafer part for analysis with STEM, TEM, etc. by extracting a micro sample...
Hitachi - Probe Station AFM5000II / Real TuneII
Manufactured by Hitachi
Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data...
Hitachi - General-purpose Small Unit AFM5100N
Manufactured by Hitachi
Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of...
Hitachi - Environment Control Unit AFM5300E
Manufactured by Hitachi
The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of...
Hitachi - Scanning Probe Microscope AFM5500M
Manufactured by Hitachi
The AFM5500M is a SPM platform equipped with a fully addressable 4-inch stage, optimized for medium-sized samples. It...
Hitachi - Ion Milling System ArBlade 5000
Manufactured by Hitachi
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples...
Hitachi - MC1000 Ion Sputter Coater
Manufactured by Hitachi
The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The...
Hitachi - Ion Milling System IM4000Plus
Manufactured by Hitachi
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider,...
Hitachi - Sample Cleaner ZONETEM
Manufactured by Hitachi
The ZONE cleaner is a powerful and easy tool for removing hydrocarbon contamination of electron microscopy samples....