FEI Company Equipment List

FEI Company - Inspect™

Manufactured by FEI Company

Inspect™ Scanning Electron Microscope

FEI Company - Magellan™ XHR

Manufactured by FEI Company

The world’s first extreme high-resolution (XHR) SEM

FEI Company - Quanta™ Series

Manufactured by FEI Company

Quanta™ Scanning Electron Microscope

FEI Company - Helios NanoLab™ DualBeam™

Manufactured by FEI Company

Imaging, analysis and control of matter at the nanoscale — keys to future research and development — are routine with...

FEI Company - Helios G4 FX DualBeam™

Manufactured by FEI Company

Enabling development of 7nm devices with shorter time to data

FEI Company - Helios™ PFIB DualBeam™

Manufactured by FEI Company

Large Area Sample Preparation and Analysis in semiconductor failure analysis, process development, and process control laboratories

FEI Company - Helios G4 CX DualBeam™

Manufactured by FEI Company

Access the highest-resolution, multi-scale, and multi-modal subsurface and 3D information

FEI Company - Helios G4 UX DualBeam™

Manufactured by FEI Company

Fastest and easiest preparation of the highest quality samples for HR S/TEM and APT

FEI Company - Helios G4 PFIB UXe DualBeam

Manufactured by FEI Company

Enabling breakthrough innovations with DualBeam™ technology—faster and easier than ever before.

FEI Company - Helios G4 PFIB CXe DualBEam

Manufactured by FEI Company

Enabling breakthrough innovations with DualBeam™ technology—faster and easier than ever before.

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